NASA NTRS · 19790010031
Diode step stress program for JANTX1N5622
Abstract
The effect was studied of power/temperature step stress when applied to the diode JANTX1N5622 manufactured by Semtech and Micro-Semiconductor. Test results, and failure analyses are included.
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1979-02-01. Diode step stress program for JANTX1N5622. https://ntrs.nasa.gov/citations/19790010031
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