NASA NTRS · 19790010032
Transistor step stress program for JANTX2N2920
Abstract
Data on the effect of power/temperature step stress when applied to the dual transistor JANTX2N2920 manufactured by Fairchild and National Semiconductor are presented. Fifty one (51) samples from Fairchild and 44 from National Semiconductor were submitted to the process outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing.
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1979-02-01. Transistor step stress program for JANTX2N2920. https://ntrs.nasa.gov/citations/19790010032
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