NASA NTRS · 19790010034
Diode step stress program for JANTX1N5619
Abstract
The effect of power/temperature step stress was studied when applied to the Diode JANTX1N5619 manufactured by Semtech and Micro-Semiconductor. Test results, and failure analyses are presented.
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1979-01-01. Diode step stress program for JANTX1N5619. https://ntrs.nasa.gov/citations/19790010034
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