NASA NTRS · 19790010035
Transistor step stress program for JANTX2N2432A
Abstract
Power/temperature step stress was applied to the transistor JANTX2N2432A manufactured by Crystalonics and Texas Instruments. A total of 48 samples from each manufacturer were submitted to the process outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing. All test samples were subjected to the electrical tests after completing the prior power/temperature step stress point.
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1979-01-01. Transistor step stress program for JANTX2N2432A. https://ntrs.nasa.gov/citations/19790010035
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