NASA NTRS · 19790010043
Diode step stress program for JANTX1N5417
Abstract
The effect of power/temperature step stress was studied when applied to the diode JANTX1N5417 manufactured by Micro Semiconductor and Semtech. Test results and failure analyses are included.
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1979-01-01. Diode step stress program for JANTX1N5417. https://ntrs.nasa.gov/citations/19790010043
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