NASA NTRS · 19790010044
Transistor step stress program for JANTX2N2605
Abstract
The effect was studied of power/temperature step stress when applied to the PNP transistor JANTX2N2605 manufactured by Raytheon and National Semiconductor. Test results and failure analyses are included.
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1979-01-01. Transistor step stress program for JANTX2N2605. https://ntrs.nasa.gov/citations/19790010044
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