NASA NTRS · 19790010046
Diode step stress program for JANTX1N645-1
Abstract
The diode JANTX1N645-1 manufactured by Semtech and Micro Semiconductor was subjected to power/temperature step stress in order to assess its reliability. All test samples were subjected to electrical tests after completing the power/temperature step stress point. Control sample units were maintained for verification of the electrical parametric testing. Results are presented in tabular form.
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1979-01-01. Diode step stress program for JANTX1N645-1. https://ntrs.nasa.gov/citations/19790010046
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