NASA NTRS · 19790010047
Transistor step stress program for JANTX2N2219A
Abstract
Power/temperature step stress was applied to the dual transistor JANTX2N2219A manufactured by Texas Instruments and National Semiconductor. A total of 48 samples from each manufacturer were submitted to the process outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing. All test samples were subjected to electrical tests after completing the prior power/temperature step stress point.
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1979-01-01. Transistor step stress program for JANTX2N2219A. https://ntrs.nasa.gov/citations/19790010047
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