NASA NTRS · 19790010081
Diode step stress testing program for JANTX1N759A
Abstract
The effect of power/temperature step stress when applied to a variety of voltage regulating diodes manufactured by Texas Instruments and Siemens was investigated. Test requirements are described and results are tabulated. Failure modes are discussed.
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1979-01-01. Diode step stress testing program for JANTX1N759A. https://ntrs.nasa.gov/citations/19790010081
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