NASA NTRS · 19790023784
Electrical Evaluation of RCA MWS5501D Random Access Memory, Volume 2, Appendix a
Abstract
The electrical characterization and qualification test results are presented for the RCA MWS5001D random access memory. The tests included functional tests, AC and DC parametric tests, AC parametric worst-case pattern selection test, determination of worst-case transition for setup and hold times, and a series of schmoo plots. The address access time, address readout time, the data hold time, and the data setup time are some of the results surveyed.
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Klute, A.. 1979-06-01. Electrical Evaluation of RCA MWS5501D Random Access Memory, Volume 2, Appendix a. https://ntrs.nasa.gov/citations/19790023784
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