NASA NTRS · 19790023785
Electrical Evaluation of RCA MWS5001D Random Access Memory, Volume 3, Appendix B
Abstract
The electrical characterization and qualification test results are presented for the RCA MWS5001D random access memory. The tests included functional tests, AC and DC parametric tests, AC parametric worst-case pattern selection test, determination of worst-case transition for setup and hold times, and a series of schmoo plots. The test values for the output voltage, average input current, the supply current and the leakage current are presented.
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Klute, A.. 1979-06-01. Electrical Evaluation of RCA MWS5001D Random Access Memory, Volume 3, Appendix B. https://ntrs.nasa.gov/citations/19790023785
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