NASA NTRS · 19790023787
Electrical Evaluation of RCA MWS5001D Random Access Memory, Volume 5, Appendix D
Abstract
The electrical characterization and qualification test results are presented for the RCA MWS 5001D random access memory. The tests included functional tests, AC and DC parametric tests, AC parametric worst-case pattern selection test, determination of worst-case transition for setup and hold times, and a series of schmoo plots. Average input high current, worst case input high current, output low current, and data setup time are some of the results presented.
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Klute, A.. 1979-06-01. Electrical Evaluation of RCA MWS5001D Random Access Memory, Volume 5, Appendix D. https://ntrs.nasa.gov/citations/19790023787
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