NASA NTRS · 19790023789
Electrical Characterization of the RCA CPD1822SD Random Access Memory, Volume 2,
Abstract
Raw data obtained from functional tests, data retention tests, and AC and DC parametric tests are presented along with schmoo plots. Rise/fall time screening results are included.
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Klute, A.. 1979-06-01. Electrical Characterization of the RCA CPD1822SD Random Access Memory, Volume 2,. https://ntrs.nasa.gov/citations/19790023789
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