NASA NTRS · 19800000012
JANTX1N2970B zener diode
Abstract
Report evaluates effects of power and temperature overstress on General Semi-conductor and Siemens devices. Excessive failure rates limited testing. Failure modes are described.
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1980-08-01. JANTX1N2970B zener diode. https://ntrs.nasa.gov/citations/19800000012
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