NASA NTRS · 19800000014
JANTX1N3016B zener diode
Abstract
Report evaluates effects of power and temperature overstress on Motorola and Siemens devices. Reverse bias leakage maximum limit failure and Zener-breakdown maximum limit failure were common. Other failures are described.
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1980-08-01. JANTX1N3016B zener diode. https://ntrs.nasa.gov/citations/19800000014
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