NASA NTRS · 19800000016
JANTX1N5622 diode
Abstract
Report describes effects of power and temperature overstress on Semtech and Micro Semiconductor diodes. Semtech devices failed with excessive reverse bias leakage due to external paint. Micro Semiconductor diodes had reverse bias leakage failure due to damaged silicon.
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1980-08-01. JANTX1N5622 diode. https://ntrs.nasa.gov/citations/19800000016
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