NASA NTRS · 19800000029
JANTX2N4150 transistor
Abstract
Report evaluates effects of power and temperature overstress on General Semiconductor and Transitron devices. General Semiconductor lot exceeded 50 percent failure 500 hours into 125 percent maximum rated power test. Catastrophic failure rates differed between manufacturers. Modes of failure are analyzed.
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1980-08-01. JANTX2N4150 transistor. https://ntrs.nasa.gov/citations/19800000029
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