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NASA NTRS ยท 19800000385

Electronic depth micrometer

Abstract

Device for measuring depth or thickness reads distance of penetration by small-diameter probe. It was developed specifically to measure thickness of wet (uncured) insulation applied to Space Shuttle structures; thin probes penetrate wet insulation to substrate, and reference surface on gage is then positioned against outer surface of insulation to measure its thickness. Gage is easy to use, even by workers wearing gloves or other protective clothing, and allows remote reading and recording of production data.

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BibTeXRIS

Major, R. K.. 1981-01-01. Electronic depth micrometer. https://ntrs.nasa.gov/citations/19800000385

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