NASA NTRS · 19800000433
CADAT test pattern generator
Abstract
CADAT test pattern generator (TPG) aids in checkout, fault detection, and fault isolation of complex digital circuits. Time and effort of manually generating digital test patterns can be major limiting factor in effectively utilizing automatic testing. This time and effort are reduced from several months to several days by TPG.
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1981-01-01. CADAT test pattern generator. https://ntrs.nasa.gov/citations/19800000433
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