Sampling, aggregation, and variance estimation for area, yield, and production in LACIE

Abstract

An approximately 2% sampling error was achieved in LACIE by sampling only approximately 2% of the sampling frame. The sample design in the yardstick region for which historical data were available down to a substratum level to support missing data resulting from cloud cover provided the most accurate estimate possible. The implemented strategy provided data of sufficient quality and quantity to support required performance levels and also to satisfy the existing constraints. The allocation scheme appeared to provide the most efficient usage of the available data and gave segment coverage of major producing areas and thus improved the probability of an accurate estimate.