NASA NTRS · 19800014110
Study of surge current effects on solid tantalum capacitors
Abstract
Results are presented of a 2,000 hour cycled life test program conducted to determine the effect of short term surge current screening on approximately 47 micron f/volt solid tantalum capacitors. The format provides average values and standard deviations of the parameters, capacitance, dissipation factor, and equivalent series resistance at 120 Hz, 1KHz, abd 40 KHz.
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1980-03-20. Study of surge current effects on solid tantalum capacitors. https://ntrs.nasa.gov/citations/19800014110
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