Cooled echelle grating spectrometer

Abstract

A cooled echelle grating spectrometer for detecting wavelengths between one micron and fifteen microns is disclosed. More specifically, the spectrometer has a cross-dispersing grating for ordering infrared energy and an echelle grating for further ordering of the infrared energy. Ordered radiation from the echelle grating is sensed by a detecting means. Also disclosed is use of a Schmidt camera for focusing the further ordered radiation from the echelle grating onto a detector array having individual detectors dispersed on a plane which substantially corresponds to a curved focal plane of the Schmidt camera. A spectrometer constructed according to the teachings of the present invention will continuously cover the spectrum between one micron and fifteen microns and have a resolution of 0.1/cm.