NASA NTRS · 19800025270
Multi-Parameter Yield Zone Model for Predicting Spectrum Crack Growth
Abstract
A systematic technique is presented for modeling crack growth load interaction effects due to spectrum loading. The Multi-Parameter Yield Zone (MPYZ) model accounts for crack growth retardation, acceleration, and underload effects. The load interactions are attributed to the residual stress intensity due to the plastic deformation at the crack tip. Fatigue crack growth was predicted and compared with test data for a variety of spectrum loadings.
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Johnson, W. S.. 1980-09-01. Multi-Parameter Yield Zone Model for Predicting Spectrum Crack Growth. https://ntrs.nasa.gov/citations/19800025270
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