Dual-Laser Schlieren System

Abstract

Proposed schlieren system uses two lasers and two knife edges to simultaneously view perpendicular refractive-index gradients in a test volume. It is improvement over conventional schlieren systems, which monitor gradient along only one axis. Although originally developed to monitor materials-processing experiments in space, it should find application wherever there is need to study two-dimensional temperature, pressure, concentration or other gradients related to index of refraction.