A comparison of screening techniques for ceramic capacitors

Abstract

The techniques involved are ultrasonic scanning, neutron radiography, scanning laser acoustic microscopy, and voltage conditioning. The test capacitor, for this first phase, is a 0.47 uF, 50V capacitor style CKR06. Eighteen of 768 devices failed in voltage conditioning with elapsed times from 15 minutes to 1239 hours. Eleven of the failures were detected by ultrasonic scanning. Four failures were found by neutron radiography. Fourteen failures showed up in the acoustic microscopy test. Three failures in voltage conditioning were not detected by any of the techniques. Failures were confirmed by destructive physical analysis. There is no direct relationship between the size of the defect and electrical failure.