NASA NTRS · 19810017855
Failure analysis methods for capacitors
Abstract
The basic steps in the failure analysis of discrete capacitors used in electronic circuit boards and hybrid assemblies are described. These steps include: visual examination; functional test; disassembly; isolation of the failure site; and documentation.
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Hildenbrand, R. L.. 1981-06-01. Failure analysis methods for capacitors. https://ntrs.nasa.gov/citations/19810017855
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