An approach to thermal-vacuum test optimization

Abstract

An analytical model is presented that simulates failure rate characteristics of spacecraft equipment progressing through component and system level thermal-vacuum test programs and on into orbit. Costs for the test programs are part of the model as well as costs attributable to the mission. A lost value function combines the performance of the equipment with these costs and allows comparisons to be made among various test combinations and the resulting predicted mission performance. A minimum overall cost program is obtained by selecting that test program that yields the lowest lost value figure.