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NASA NTRS · 19820006342

Electron-beam-charged dielectrics: Internal charge distribution

Abstract

Theoretical calculations of an electron transport model of the charging of dielectrics due to electron bombardment are compared to measurements of internal charge distributions. The emphasis is on the distribution of Teflon. The position of the charge centroid as a function of time is not monotonic. It first moves deeper into the material and then moves back near to the surface. In most time regimes of interest, the charge distribution is not unimodal, but instead has two peaks. The location of the centroid near saturation is a function of the incident current density. While the qualitative comparison of theory and experiment are reasonable, quantitative comparison shows discrepancies of as much as a factor of two.

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BibTeXRIS

Beers, B. L., Pine, V. W.. 1981-10-01. Electron-beam-charged dielectrics: Internal charge distribution. https://ntrs.nasa.gov/citations/19820006342

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