NASA NTRS · 19820006342
Electron-beam-charged dielectrics: Internal charge distribution
Abstract
Theoretical calculations of an electron transport model of the charging of dielectrics due to electron bombardment are compared to measurements of internal charge distributions. The emphasis is on the distribution of Teflon. The position of the charge centroid as a function of time is not monotonic. It first moves deeper into the material and then moves back near to the surface. In most time regimes of interest, the charge distribution is not unimodal, but instead has two peaks. The location of the centroid near saturation is a function of the incident current density. While the qualitative comparison of theory and experiment are reasonable, quantitative comparison shows discrepancies of as much as a factor of two.
Keep this discovery
Explore connections, maps & timelines
Beers, B. L., Pine, V. W.. 1981-10-01. Electron-beam-charged dielectrics: Internal charge distribution. https://ntrs.nasa.gov/citations/19820006342
Cite the original work for its findings. Save a collection to share your selection of sources.