NASA NTRS ยท 19820018464
Industry needs for silicon crystals and standards
Abstract
The trend of the device fabrication industry requirement for larger crystals is reviewed. The ranges of properties and uniformities measurement standards needed for resistivity (four-point probe and spreading resistance) and for the chemical composition of oxygen and carbon impurities are presented.
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Benson, K. E.. 1981-09-01. Industry needs for silicon crystals and standards. https://ntrs.nasa.gov/citations/19820018464
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