NASA NTRS · 19820036975
Multi-parameter yield zone model for predicting spectrum crack growth
Abstract
A phenomenological load interaction model referred to as the Multi-Parameter Yield Zone model is presented which accounts for crack growth retardation caused by previous overloads, acceleration due to current overloads, and underload effects. In the present model, load interaction effects are calculated utilizing a residual stress intensity concept. Crack growth retardation and acceleration are accounted for by decreasing or increasing, respectively, the effective stress ratio used in a modified Forman's (1967) crack growth equation. Results of spectrum crack growth predictions for 2219-T851 aluminum are presented.
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Johnson, W. S.. 1981-01-01. Multi-parameter yield zone model for predicting spectrum crack growth. https://ntrs.nasa.gov/citations/19820036975
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