NASA NTRS · 19830000333
Improving Trace-Ion Sensitivity
Abstract
Background noise reduced by some special precautions. Blanket of argon flows over solution so no chance for contamination from air to creep in. Conventional pump replaced with one made of polytetrafluoroethlylene component and all metal couplings eliminated from flow lines. Used to improve quality control in integrated circuit fabrication, lens fabrication, and vacuum-tube assembly.
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Buggle, R. N.. 1984-04-01. Improving Trace-Ion Sensitivity. https://ntrs.nasa.gov/citations/19830000333
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