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NASA NTRS ยท 19830007606

Deep impurity trapping concepts for power semiconductor devices

Abstract

High voltage semiconductor switches using deep impurity doped silicon now appear feasible for high voltage (1-100 kV), high power (10 Kw) switching and protection functions for future space power applications. Recent discoveries have demonstrated several practical ways of gating deep impurity doped silicon devices in planar configurations and of electrically controlling their characteristics, leading to a vast array of possible circuit applications. A new family of semiconductor switching devices and transducers are possible based on this technology. New deep impurity devices could be simpler than conventional p-n junction devices and yet use the same basic materials and processing techniques. In addition, multiple functions may be possible on a single device as well as increased ratings.

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BibTeXRIS

Sundberg, G. R.. 1982-01-01. Deep impurity trapping concepts for power semiconductor devices. https://ntrs.nasa.gov/citations/19830007606

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