NASA NTRS ยท 19830009129
Investigation of compositional segregation during unidirectional solidification of solid solution semiconducting alloys
Abstract
Compositional segregation of solid solution semiconducting alloys in the radial direction during unidirectional solidification was investigated by calculating the effect of a curved solid liquid interface on solute concentration at the interface on the solid. The formulation is similar to that given by Coriell, Boisvert, Rehm, and Sekerka except that a more realistic cylindrical coordinate system which is moving with the interface is used. Analytical results were obtained for very small and very large values of beta with beta = VR/D, where V is the velocity of solidification, R the radius of the specimen, and D the diffusivity of solute in the liquid. For both very small and very large beta, the solute concentration at the interface in the solid C(si) approaches C(o) (original solute concentration) i.e., the deviation is minimal. The maximum deviation of C(si) from C(o) occurs for some intermediate value of beta.
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Wang, J. C.. 1982-08-01. Investigation of compositional segregation during unidirectional solidification of solid solution semiconducting alloys. https://ntrs.nasa.gov/citations/19830009129
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