NASA NTRS · 19830031511
High resolution X-ray scattering measurements
Abstract
The results of high angular resolution grazing incidence scattering measurements of highly polished, coated optical flats in the X-ray spectral range of 1.5 to 6.4 keV are reported. The interpretation of these results in terms of surface microtopography is presented and the implications for grazing incidence X-ray imaging are discussed.
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Zombeck, M. V., Braeuninger, H., Ondrusch, A., Predehl, P.. 1982-01-01. High resolution X-ray scattering measurements. https://ntrs.nasa.gov/citations/19830031511
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