NASA NTRS · 19830041047
Comparison of NDE techniques for sintered-SiC components
Abstract
High frequency, bulk-wave ultrasonics detected defects in manufactured SiC components. In addition, gas-turbine blades and vanes were examined by scanning laser acoustic microscopy (SLAM). Comparative results obtained on simple shapes such as disks and bars by microfocus X-ray radiography, ultrasonics, scanning photoacoustic spectroscopy, and SLAM are discussed.
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Srinivasan, M., Lawler, D., Inglehart, L. J., Thomas, R. L., Yuhas, D.. 1982-10-01. Comparison of NDE techniques for sintered-SiC components. https://ntrs.nasa.gov/citations/19830041047
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