NASA NTRS ยท 19840020571
Structural Characterization of Solar Silicon
Abstract
Compared to single crystal silicon, solar silicon generally contains large residual stresses and numerous structural defects. During subsequent processing, the defect structure can undergo further changes since, at the high temperatures required for diffusion, dislocations are sufficiently mobile to rearrange themselves in patterns which reduce long range residual stresses. This process, which is similar to the polygonization of strained metals, has no counterpart in single crystal silicon. Many of the solar silicon materials are grown from graphite dies and crucibles and therefore contain carbon concentrations in excess of 1E18. The interactions between carbon, crystal defects, intrinsic point defects, oxygen and diffusing dopants are discussed.
Keep this discovery
Explore connections, maps & timelines
Ast, D. G.. 1984-04-15. Structural Characterization of Solar Silicon. https://ntrs.nasa.gov/citations/19840020571
Cite the original work for its findings. Save a collection to share your selection of sources.