NASA NTRS · 19840031502
Microstructural characterization of SiC (SCS) filaments
Abstract
Microstructural features of SiC('SCS') fibers demonstrating growth properties have been investigated using scanning and transmission electron microscopy. An etchant of fused KOH:KNO3 was developed which adequately brought out previously undetermined features.
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Wawner, F. W., Teng, A. Y., Nutt, S. R.. 1983-04-01. Microstructural characterization of SiC (SCS) filaments. https://ntrs.nasa.gov/citations/19840031502
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