Characterization and measurement of phase-locked loop performance

Abstract

A set of performance measures and tests are presented which can be implemented at the 'black box' level for the characterization of such statistical aspects of phase-locked loop behavior as the acquisition and tracking threshold, phase error jitter, Doppler accuracy, etc. Also presented is an automatic measurement system, designated the Statistical Loop Analyzer, which has been developed in order to undertake these phase-locked device performance measurements.