NASA NTRS · 19850023539
Exponential order statistic models of software reliability growth
Abstract
Failure times of a software reliabilty growth process are modeled as order statistics of independent, nonidentically distributed exponential random variables. The Jelinsky-Moranda, Goel-Okumoto, Littlewood, Musa-Okumoto Logarithmic, and Power Law models are all special cases of Exponential Order Statistic Models, but there are many additional examples also. Various characterizations, properties and examples of this class of models are developed and presented.
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Miller, D. R.. 1985-07-01. Exponential order statistic models of software reliability growth. https://ntrs.nasa.gov/citations/19850023539
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