NASA NTRS · 19850024096
Interfacial bonding stability
Abstract
Interfacial bonding stability by in situ ellipsometry was investigated. It is found that: (1) gamma MPS is an effective primer for bonding ethylene vinyl acetate (EVA) to aluminum; (2) ellipsometry is an effective in situ technique for monitoring the stability of polymer/metal interfaces; (3) the aluminized back surface of silicon wafers contain significant amounts of silicon and may have glass like properties.
Keep this discovery
Explore connections, maps & timelines
Boerio, J.. 1984-10-01. Interfacial bonding stability. https://ntrs.nasa.gov/citations/19850024096
Cite the original work for its findings. Save a collection to share your selection of sources.