Ramp technique for dc partial discharge testing

Abstract

The partial discharge (PD) data presently obtained by means of a stepwise ramp technique, for the cases of high voltage (HV) components and such resin-packaged HV devices as the Space Telescope's Faint Object Camera, is acquired separately on part-way ramps to rated voltage and on the intermediate voltage plateaus. For test specimens intended for dc service, this ramp method yields more data on insulation integrity than quiescent dc measurements, especially in the case of specimens of high resistivity which causes the discharge frequency to be deceptively low at constant dc voltage. During upward ramping the voltage distribution is capacitive, and the PD behavior resembles that of an ac test. Many more pulses are obtained in the voids without the heat otherwise generated by the application of 60-Hz ac. PD histograms are presented for various materials, with and without intentional defects.