NASA NTRS · 19860000034
Computing Composition/Depth Profiles From X-Ray Diffraction
Abstract
Diffraction-intensity bands deconvolved relatively quickly. TIBAC constructs composition/depth profiles from X-ray diffraction-intensity bands. Intensity band extremely sensitive to shape of composition/depth profile. TIBAC incorporates straightforward transformation of intensity band that retains accuracy of earlier simulation models, but is several orders of magnitude faster in total computational time. TIBAC written in FORTRAN 77 for batch execution.
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Wiedemann, K. E., Unnam, J.. 1986-06-01. Computing Composition/Depth Profiles From X-Ray Diffraction. https://ntrs.nasa.gov/citations/19860000034
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