NASA NTRS · 19860000060
Higher Sensitivity in X-Ray Photography
Abstract
Hidden defects revealed if X-ray energy decreased as exposure progresses. Declining-potential X-ray photography detects fractures in thin metal sheet covered by unbroken sheet of twice thickness. Originally developed to check solder connections on multilayer circuit boards, technique has potential for other nondestructive testing.
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Buggle, R. N.. 1986-06-01. Higher Sensitivity in X-Ray Photography. https://ntrs.nasa.gov/citations/19860000060
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