NASA NTRS · 19860000122
Mapping the Structure of Heterogeneous Materials
Abstract
Image-processing microdensitometer/Fourier analyzer yields statistics of subcomponent distribution. Nondestructive method for studying structure heterogeneous materials uses energy-dispersive X-ray analysis in scanning electron microscope. Scanning microdensitometer/Fourier analyzer (SMFA) is applied to SEM images to obtain statistics about sample structure. Method originally developed for studying effect on combustion of fine structure of composite solid propellants.
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Strand, L. D., Cohen, N. S., Hernan, M. A.. 1986-05-01. Mapping the Structure of Heterogeneous Materials. https://ntrs.nasa.gov/citations/19860000122
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