NASA NTRS · 19860019932
Amorphous-silicon cell reliability testing
Abstract
The work on reliability testing of solar cells is discussed. Results are given on initial temperature and humidity tests of amorphous silicon devices. Calibration and measurement procedures for amorphous and crystalline cells are given. Temperature stress levels are diagrammed.
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Lathrop, J. W.. 1985-06-01. Amorphous-silicon cell reliability testing. https://ntrs.nasa.gov/citations/19860019932
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