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NASA NTRS ยท 19870006996

Solar cell reliability testing

Abstract

The progress and initial data on accelerated stress tests on small amorphous silicon test samples from several manufacturers are reported. The test samples include both single and tandem junction devices.

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BibTeXRIS

Lathrop, J.. 1986-01-01. Solar cell reliability testing. https://ntrs.nasa.gov/citations/19870006996

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