NASA NTRS · 19870023477
Quantitative thermal characterization of thin plates
Abstract
The principles of quantitative thermal testing of the mechanical integrity of platelike structures are discussed. In this technique, a scanned laser pulse is used to inject a thermal pattern in a sample, and a thermal IR imager is used to document the evolution of the pattern subsequent to injection. The measurements are remote, noncontacting, and one-sided, and the algorithms used to obtain diffusivity are all emissivity-independent. The results yielded by application of the three analytical techniques, used to obtain diffusivity values from the image data on stainless steel, a graphite-epoxy composite, brass, and aluminum 2024 samples, are presented.
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Welch, C. S., Heath, D. M., Winfree, W. P.. 1986-01-01. Quantitative thermal characterization of thin plates. https://ntrs.nasa.gov/citations/19870023477
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