NASA NTRS · 19870036625
A computerized test system for thermal-mechanical fatigue crack growth
Abstract
A computerized testing system to measure fatigue crack growth under thermal-mechanical fatigue conditions is described. Built around a servohydraulic machine, the system is capable of a push-pull test under stress-controlled or strain-controlled conditions in the temperature range of 25 to 1050 C. Temperature and mechanical strain are independently controlled by the closed-loop system to simulate the complex inservice strain-temperature relationship. A d-c electrical potential method is used to measure crack growth rates. The correction procedure of the potential signal to take into account powerline and RF-induced noises and thermal changes is described. It is shown that the potential drop technique can be used for physical mechanism studies and for modelling crack tip processes.
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Marchand, N., Pelloux, R. M.. 1986-11-01. A computerized test system for thermal-mechanical fatigue crack growth. https://ntrs.nasa.gov/citations/19870036625
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