NASA NTRS · 19880000020
Automatically Inspecting Thin Ceramics For Pinholes
Abstract
Proposed apparatus for inspecting prefired ceramic materials detects minute flaws that might escape ordinary visual inspections. Method detects flaws and marks locations. Intended for such thin ceramic parts as insulation in capacitors and some radio-frequency filters.
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Honaker, James R.. 1988-01-01. Automatically Inspecting Thin Ceramics For Pinholes. https://ntrs.nasa.gov/citations/19880000020
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