NASA NTRS · 19880000033
Optimization of Processing of Si3N4
Abstract
Process changes iterated under guidance of x-radiography. In recent work at NASA Lewis Research Center, density gradients in sintered silicon nitride, characterized by x-radiography, identified and appeared strongly dependent upon powder-processing and sintering conditions. NASA technical memorandum describes systematic investigation, based upon preliminary work, of density-gradient/flexural-strength relationships as affected by processing.
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Sanders, William A., Baaklini, George Y.. 1988-01-01. Optimization of Processing of Si3N4. https://ntrs.nasa.gov/citations/19880000033
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